Microtest 8740FA
362401
Microtest 8740FA/8740NA/8740N
Microtest 8740FA/8740NA/8740N
0.00

Product Description:

The newly launched series of the MICROTEST 8740 professional wire testing instrument could have three different test points, such as 128/256 and 512. Unlike the traditional wire testing instruments, the 8740 professional wire testing instrument uses dual processing unit in the inner part and carries on an analogy signal sampling measurement by DSP processor to accelerate the processing speed. By updating the principle, it is able to get rid of the past measurement methods of using the RMS-to-DC element integral and to save the time. It adds the 400MHz ARM 9 processor to design the man-machine interface operation to make the display refresh speed increase 300%.

It provides a completed RS232 communication to transfer the test results back to the PC terminal for storage as well. The built-in memory space can store more than 200 groups of the test files. It supports the RS232, USB and the Printer interfaces. It can be applied in all kinds of wires, connectors, and the connector and wire combine products tests and be able to meet all kinds of wire multi-point testing requirement. There is a special version for USB-C test, meet all your demand!!

  • 128 / 256 / 512 testing points
  • Number of test file up to 500 sets
  • Multiple DUT testing – 4 pieces(standard)/14 pieces(option)
  • Identify the defective step of sequencial multiple DUT test
  • Automatically identify the normal or reverse plugin of connectors
  • Capacitor polarity and diode leakage current test
  • DC Hipot insulation test rapidly
  • AC/DC Hipot leakage current test rapidly
  • With single ended cable Open/Short test and HV Insulation/Leakage Current Test
  • With Open/Short/Conductance/Components test
  • Extendable testing ranges of Open/Short: 2k ~ 100kΩ
  • Advanced technology high speed of “Intermittence Open/ Short and Conductance Test”
  • USB (Software update, test results storage, files up/down)
  • With Speaker/Earphone jack
  • LCD contrast/Sound Volume (adjustable)

Product Specification:

Measurement Data

       
Model 8740N 8740NA 8740FA
AC Hipot  – 100 ~ 700V 100-1000V
DC Hipot 50 ~ 1000V  50 ~ 1000V 50-1500V
AC Hipot Leakage Current 0.01mA ~5mA
DC Hipot Leakage Current 0.1µA ~ 1000µA
DC Hipot Insulation 1MΩ ~ 1GΩ
Hipot Output Accuracy ±5%
Hipot Measurement Accuracy ±5%    
Rated Output 5Vdc    
Low Voltage Resistance 0.1Ω ~ 1MΩ    
Ponit of Test 128/256/512 Points 128/256/512 Points 128/256 Points
Basic Measurement Time 0.01 Second
Test Scan Mode Auto, Manual, External Trigger
Measurement Signal Low Voltage Measurement Signal
DUT Requirement Maximum Electric Capacity Allowance 1μF
Panel System / Rapid / Edit / Function
Indicator Pass/Fail HV LED red-green indicator lights/Screen Display/Sound

Specification

   
Power Supply Fixed Voltage 115 / 230 Vac ±10%
  Frequency 60 / 50 Hz
Display 320*240 dot-matrix display
Interface Printer Port, RS-232, USB
Flash Memory Store up to 500 Sets of Test Settings Files
Operation Manual、 Auto、 Remote Control
Environment Temperature :15 ~ 35  Humidity : RH75%
Dimension (W*H*D) 425x190x350 mm
Weight 14 Kg

Parameters Measurement Ranges

   
Item Range
Open/Short 2KΩ ~ 100KΩ
Intermittence Open/ Short 2KΩ ~ 100KΩ
Open/Short determinal Judge Judge Momentary Broken Circuit
Conductance Max.50.0Ω
Resistance Max.1MΩ
Capacitance 10pF ~ 1µF
Diode 0 – 7V
IR 1MΩ ~ 1GΩ
Single-Side Test Able to do the Single-Side Test
AC Hipot Leakage Current  0.01mA ~5mA
DC Hipot Leakage Current  0.1µA ~ 1000µA

Advanced Functions 

 
Programmable continuous test
Pin search
Auto-diagnosis

Application

All kinds of wires, connectors

  • Açıklama
    • Product Description:

      The newly launched series of the MICROTEST 8740 professional wire testing instrument could have three different test points, such as 128/256 and 512. Unlike the traditional wire testing instruments, the 8740 professional wire testing instrument uses dual processing unit in the inner part and carries on an analogy signal sampling measurement by DSP processor to accelerate the processing speed. By updating the principle, it is able to get rid of the past measurement methods of using the RMS-to-DC element integral and to save the time. It adds the 400MHz ARM 9 processor to design the man-machine interface operation to make the display refresh speed increase 300%.

      It provides a completed RS232 communication to transfer the test results back to the PC terminal for storage as well. The built-in memory space can store more than 200 groups of the test files. It supports the RS232, USB and the Printer interfaces. It can be applied in all kinds of wires, connectors, and the connector and wire combine products tests and be able to meet all kinds of wire multi-point testing requirement. There is a special version for USB-C test, meet all your demand!!

      • 128 / 256 / 512 testing points
      • Number of test file up to 500 sets
      • Multiple DUT testing – 4 pieces(standard)/14 pieces(option)
      • Identify the defective step of sequencial multiple DUT test
      • Automatically identify the normal or reverse plugin of connectors
      • Capacitor polarity and diode leakage current test
      • DC Hipot insulation test rapidly
      • AC/DC Hipot leakage current test rapidly
      • With single ended cable Open/Short test and HV Insulation/Leakage Current Test
      • With Open/Short/Conductance/Components test
      • Extendable testing ranges of Open/Short: 2k ~ 100kΩ
      • Advanced technology high speed of “Intermittence Open/ Short and Conductance Test”
      • USB (Software update, test results storage, files up/down)
      • With Speaker/Earphone jack
      • LCD contrast/Sound Volume (adjustable)

      Product Specification:

      Measurement Data

             
      Model 8740N 8740NA 8740FA
      AC Hipot  – 100 ~ 700V 100-1000V
      DC Hipot 50 ~ 1000V  50 ~ 1000V 50-1500V
      AC Hipot Leakage Current 0.01mA ~5mA
      DC Hipot Leakage Current 0.1µA ~ 1000µA
      DC Hipot Insulation 1MΩ ~ 1GΩ
      Hipot Output Accuracy ±5%
      Hipot Measurement Accuracy ±5%    
      Rated Output 5Vdc    
      Low Voltage Resistance 0.1Ω ~ 1MΩ    
      Ponit of Test 128/256/512 Points 128/256/512 Points 128/256 Points
      Basic Measurement Time 0.01 Second
      Test Scan Mode Auto, Manual, External Trigger
      Measurement Signal Low Voltage Measurement Signal
      DUT Requirement Maximum Electric Capacity Allowance 1μF
      Panel System / Rapid / Edit / Function
      Indicator Pass/Fail HV LED red-green indicator lights/Screen Display/Sound

      Specification

         
      Power Supply Fixed Voltage 115 / 230 Vac ±10%
        Frequency 60 / 50 Hz
      Display 320*240 dot-matrix display
      Interface Printer Port, RS-232, USB
      Flash Memory Store up to 500 Sets of Test Settings Files
      Operation Manual、 Auto、 Remote Control
      Environment Temperature :15 ~ 35  Humidity : RH75%
      Dimension (W*H*D) 425x190x350 mm
      Weight 14 Kg

      Parameters Measurement Ranges

         
      Item Range
      Open/Short 2KΩ ~ 100KΩ
      Intermittence Open/ Short 2KΩ ~ 100KΩ
      Open/Short determinal Judge Judge Momentary Broken Circuit
      Conductance Max.50.0Ω
      Resistance Max.1MΩ
      Capacitance 10pF ~ 1µF
      Diode 0 – 7V
      IR 1MΩ ~ 1GΩ
      Single-Side Test Able to do the Single-Side Test
      AC Hipot Leakage Current  0.01mA ~5mA
      DC Hipot Leakage Current  0.1µA ~ 1000µA

      Advanced Functions 

       
      Programmable continuous test
      Pin search
      Auto-diagnosis

      Application

      All kinds of wires, connectors

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